Best Technical Support Contribution Award
Ayumi Kimura (The University of Tokyo)
"Technical support by Cryo-Transmission Electron Microscope (Cryo-TEM)"

Mitsunari Auchi (Kyushu University)
"Technical support for TEM sample preparation and microstructure analysis using focused ion beam equipment"

Koichi Higashimine (Japan Advanced Institute of Science and Technology)
"Observations of microscopic structure near the interface of different materials using electron energy loss spectroscopy and multivariate analysis"

Haruyo Nagao (Institute for Molecular Science)
"Technical Support Using NMR and Thermal Analysis Equipment, etc."

Young Technical Skill Award
Ryoko Yokohira (Hokkaido University)
"Technical support from sample preparation to observation for multiple fields"

nano tech 2024 Poster Exhibition

1. Technical support by Cryo-Transmission Electron Microscope (Cryo-TEM)
2. Technical support for TEM sample preparation and microstructure analysis using focused ion beam equipment
3. Observations of microscopic structure near the interface of different materials using electron energy loss spectroscopy and multivariate analysis
4. Technical Support Using NMR and Thermal Analysis Equipment, etc.
5. Technical support from sample preparation to observation for multiple fields

*Click each image to download a PDF file.

1

2

3

4

5