Best Technical Support Contribution Award
Kenji Ohkubo, Takashi Tanioka, Ryo Ota, Ryoko Yokohira (Advanced Characterization Nanotechnology Platform, Hokkaido University)
"Technical support in the multi-quantum beam high voltage electron microscope laboratory"

Yumiko Kodama (Advanced Characterization Nanotechnology Platform, Tohoku University)
"Technical Supports by using Dual Beam-FIB"

Ko Onishi, Wakako Nakano (Nanofabrication Platform, Hokkaido University)
"Supports for material developments using nanofabrication techniques"

Motoyasu Fujiwara, Mizue Asada, Shinako Iki (Molecule & Material Synthesis Platform, Institute for Molecular Science)
"Technical Supporting of Electron Spin Resonance"

Shohei Katao (Molecule & Material Synthesis Platform, Nara Institute of Science and Technology)
"Technical support by single crystal X-ray structual analysis"

Young Technical Skill Award
Takashi Endo (Advanced Characterization Nanotechnology Platform, Hokkaido University)
"Technical Support for Advanced Characterization Using FIB-SEM"

nano tech 2020 Poster Exhibition

1. Technical support in the multi-quantum beam high voltage electron microscope laboratory
2. Technical Supports by using Dual Beam-FIB
3. Supports for material developments using nanofabrication techniques
4. Technical Supporting of Electron Spin Resonance
5. Technical support by single crystal X-ray
6. Technical Support for Advanced Characterization Using FIB-SEM

*Click each image to download a PDF file.

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