Best Technical Skill Award
Takaaki Toriyama (Advanced Characterization Nanotechnology Platform, Kyushu University)
"Electron microscope observation and analysis of highly sensitive materials electron irradiation"

Best Technical Support Contribution Award
Tomoyo Nakao (Advanced Characterization Nanotechnology Platform, Nagoya University)
"Microstructure analysis by high quality FIB technique"

Hirotaka Ohsato (Nanofabrication Platform, National Institute for Materials Science)
"Dry etching techniques for process solutions"

Hiroyuki Oshikawa (Advanced Characterization Nanotechnology Platform, The University of Tokyo)
"Supporting by advanced specimen preparation technique for TEM/STEM observations"

Young Technical Skill Award
Tadashi Sato (Nanofabrication Platform, Hiroshima University)
"Total solution of silicon"

nano tech 2019 Poster Exhibition

1. Electron microscope observation and analysis of highly sensitive materials electron irradiation
2. Microstructure analysis by high quality FIB technique
3. Dry etching techniques for process solutions
4. Supporting by advanced specimen preparation technique for TEM/STEM observations
5. Total solution of silicon

*Click each image to download a PDF file.

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