Best Technical Skill Award
Shigeo Arai (Advanced Characterization Nanotechnology Platform, Nagoya University)
"Supports of the study using Reaction Science HVEM"
Best Technical Support Contribution Award
Kouhei Okitsu (Advanced Characterization Nanotechnology Platform, The University of Tokyo)
"Support system for X-ray apparatuses utilizing computer network"
Young Technical Skill Award
Yuta Yamamoto (Advanced Characterization Nanotechnology Platform, Nagoya University)
"Suggestion for Particle Size Analytical Method of Electron Micrograph"
nano tech 2017 Poster Exhibition
1. Supports of the study using Reaction Science HVEM
2. Support system for X-ray apparatuses utilizing computer network
3. Suggestion for Particle Size Analytical Method of Electron Micrograph
*Click each image to download a PDF file.
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