【公開日：2024.07.25】【最終更新日：2024.07.01】
課題データ / Project Data
課題番号 / Project Issue Number
23QS0005
利用課題名 / Title
Key Technique Research and Performance Characterization of the Diced Crystal Analyzer for High Energy Resolution Inelastic X-ray Scattering Spectroscopies
利用した実施機関 / Support Institute
量子科学技術研究開発機構 / QST
機関外・機関内の利用 / External or Internal Use
外部利用/External Use
技術領域 / Technology Area
【横断技術領域 / Cross-Technology Area】（主 / Main）計測・分析/Advanced Characterization（副 / Sub）-
【重要技術領域 / Important Technology Area】（主 / Main）その他/Others（副 / Sub）-
キーワード / Keywords
装置開発,放射光/ Synchrotron radiation
利用者と利用形態 / User and Support Type
利用者名（課題申請者）/ User Name (Project Applicant)
Xu Wei
所属名 / Affiliation
Institute of High Energy Physics, Chinese Academy of Sciences
共同利用者氏名 / Names of Collaborators in Other Institutes Than Hub and Spoke Institutes
Yujun Zhang,Guo Zhiying,Shuoxue Jin,Yingke Huang,Ou Zina,Ming Li
ARIM実施機関支援担当者 / Names of Collaborators in The Hub and Spoke Institutes
石井 賢司
利用形態 / Support Type
（主 / Main）共同研究/Joint Research（副 / Sub）-
利用した主な設備 / Equipment Used in This Project
報告書データ / Report
概要（目的・用途・実施内容）/ Abstract (Aim, Use Applications and Contents)
The purpose of the experiment is to measure the performance of crystal analyzers fabricated by gluing or vacuum-mounting methods, respectively. The high energy resolution resonant inelastic X-ray scattering (RIXS) spectrometer at BL11XU is used. The measured results are close to theoretical estimations. The crystal analyzers could be used for RIXS experiments with good energy resolution at Cu K-edge.
実験 / Experimental
The crystal analyzers are characterized by measuring X-ray reflectivity curves. The analyzers were characterized at BL11XU of the SPring-8 with a 2 m RIXS spectrometer in a horizontal Rowland circle geometry. The beamline was equipped with a Si (111) monochromator followed by four-bunch Si (553) monochromator. The incident bandwidth was measured by rotating a perfect Si (553) crystal in almost exact backscattering, giving an energy spread of 28.2 meV FWHM at 8.985 keV. The beam was about 42 μm (horizontal)×540 μm (vertical) at the sample position, thus the source size contribution to the total resolution was about 40.3 meV FWHM at the working energy. The analyzer was mounded on the spectrometer and a 25μm Kapton film file was used as a scatterer.
結果と考察 / Results and Discussion
We have characterized the instrumental resolution, contributed by the intrinsic resolution of crystal analyzers, geometery and incident bandwith. We are able to obtain energy resolution of the crystal analyers close to its intrinsic property, due to the extremely narrow bandwidth of the incident beam and the precise RIXS spectrometer. The total energy resolution as measured is 63.0 meV. The incident bandwidth is 17 meV. The geometric contribution due to beam spotsize is 40.3 meV. Considering the Guassian ditribution of instrumental function, the intrinsic energy solution of 2 m diced Si(533) crystal analyzer is estimated through experiments as 37.3 meV at 8985 eV. Moreover, with the new adapter developed by Dr. K. Ishii, we have successfully measured the performance of vacuum mounted analyzers (2m spherically bent, Si(553), diced). The total measured energy resolution is 65.3 meV, very close to the glued analyzers. The precise measurements at BL11XU, thanks to the state-of-the-art 4-bounce high energy resolution monochromator and the RIXS spectrometer, provides a unique opportunity for the instrumentation development. With the results, we are encouraged to further develop high-energy resolution crystal analyzers for the inelastic X-ray scattering community. In the future, we also plan to fabricate and utilize other crystal analyzers targeting for edges of elements of great scientific interests.
図・表・数式 / Figures, Tables and Equations
その他・特記事項（参考文献・謝辞等） / Remarks(References and Acknowledgements)
We acknowledge the beamtime as allocated by beamline BL11XU at SPring-8. (JASRI proposal No. 2023A3597, ARIM proposal No. JPMXP1223QS0005). Many thanks to Dr. Kenji Ishii for his kind and hard work for characterizing the analyzer.
成果発表・成果利用 / Publication and Patents
論文・プロシーディング（DOIのあるもの） / DOI (Publication and Proceedings)
口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.
特許 / Patents
特許出願件数 / Number of Patent Applications：1件
特許登録件数 / Number of Registered Patents：0件