【公開日：2024.07.25】【最終更新日：2024.05.13】

課題データ / Project Data

課題番号 / Project Issue Number

23NM0155

利用課題名 / Title

TEM Analysis of Materials Treated in Ammonia environment

利用した実施機関 / Support Institute

物質・材料研究機構 / NIMS

機関外・機関内の利用 / External or Internal Use

外部利用/External Use

技術領域 / Technology Area

【横断技術領域 / Cross-Technology Area】（主 / Main）計測・分析/Advanced Characterization（副 / Sub）-

【重要技術領域 / Important Technology Area】（主 / Main）マルチマテリアル化技術・次世代高分子マテリアル/Multi-material technologies / Next-generation high-molecular materials（副 / Sub）-

キーワード / Keywords

表面・界面/ Surface and Interface, 各種表面処理等/ Various surface treatments,コンポジット材料/ Composite material

利用者と利用形態 / User and Support Type

利用者名（課題申請者）/ User Name (Project Applicant)

Ghara Tina

所属名 / Affiliation

産業技術総合研究所

共同利用者氏名 / Names of Collaborators in Other Institutes Than Hub and Spoke Institutes

ARIM実施機関支援担当者 / Names of Collaborators in The Hub and Spoke Institutes

利用形態 / Support Type

（主 / Main）技術補助/Technical Assistance（副 / Sub）-

利用した主な設備 / Equipment Used in This Project

NM-503：200kV電界放出形透過電子顕微鏡（JEM-2100F1）
NM-504：200kV電界放出形透過電子顕微鏡（JEM-2100F2）
NM-516：TEM試料作製装置群

報告書データ / Report

概要（目的・用途・実施内容）/ Abstract (Aim, Use Applications and Contents)

We will evaluate the corrosion protection layer of materials in an ammonia environment by TEM with the aim of developing an optimal coating layer. Analysis of the microstructure and composition of the nitride layer formed on the alloy surface and the coatings deposited on it will be performed by TEM. We request technical assistance until we have the skills to use TEM.

実験 / Experimental

TEM Bright Field and Dark Field micrographs of Au nano-particles were acquired. Moreover, corresponding Selected Area Diffraction patterns (SADP) were also obtained. 

結果と考察 / Results and Discussion

The TEM BF image of Au nano-particles are shown in Fig.1. The BF micrograph of Si obtained through TEM is shown in Fig.2, and the corresponding SADP is presented in Fig.3 depicting diamond like FCC crystal. HRTEM image and corresponding FFT of Si are shown in Fig.4, and Fig.5, respectively.

図・表・数式 / Figures, Tables and Equations

Fig.1. TEM BF image of Au nano-particles

Fig.2. TEM BF micrograph of Si

Fig.3. SADP of Si from Fig.2

Fig.4. HRTEM image of Si

Fig.5. FFT of Fig.4

その他・特記事項（参考文献・謝辞等） / Remarks(References and Acknowledgements)

The author would like to thank Dr. Akira Hasegawa, Dr. Isaka Noriko from national Institute for Materials Science for their immense assistance and support during the work.

成果発表・成果利用 / Publication and Patents

論文・プロシーディング（DOIのあるもの） / DOI (Publication and Proceedings)

口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.

特許 / Patents

特許出願件数 / Number of Patent Applications：0件
特許登録件数 / Number of Registered Patents：0件