【公開日：2024.07.25】【最終更新日：2024.05.29】
課題データ / Project Data
課題番号 / Project Issue Number
23UT1106
利用課題名 / Title
Characterization of the out-of-plane deformation of shear band on metal surface
利用した実施機関 / Support Institute
東京大学 / Tokyo Univ.
機関外・機関内の利用 / External or Internal Use
内部利用（ARIM事業参画者以外）/Internal Use (by non ARIM members)
技術領域 / Technology Area
【横断技術領域 / Cross-Technology Area】（主 / Main）計測・分析/Advanced Characterization（副 / Sub）-
【重要技術領域 / Important Technology Area】（主 / Main）その他/Others（副 / Sub）-
キーワード / Keywords
Titanium-based alloys, out-of-plane deformation, a dwell-fatigue loading,光学顕微鏡/ Optical microscope
利用者と利用形態 / User and Support Type
利用者名（課題申請者）/ User Name (Project Applicant)
榎 学
所属名 / Affiliation
東京大学工学系研究科マテリアル工学専攻
共同利用者氏名 / Names of Collaborators in Other Institutes Than Hub and Spoke Institutes
ARIM実施機関支援担当者 / Names of Collaborators in The Hub and Spoke Institutes
利用形態 / Support Type
（主 / Main）機器利用/Equipment Utilization（副 / Sub）-
利用した主な設備 / Equipment Used in This Project
報告書データ / Report
概要（目的・用途・実施内容）/ Abstract (Aim, Use Applications and Contents)
To characterize the out-of-plane deformation along slip bands of a titanium-based alloy under dwell-fatigue conditions.
実験 / Experimental
A tensile specimen was subjected to a dwell-fatigue loading (peak stress: 870 MPa, r ratio: 0.1) to1000 cycles. Out of plane deformation of the specimen surface was characterized by laser confocal microscopy(Fig.1).
結果と考察 / Results and Discussion
Surfaces roughness maps were calculated by passing the surface height maps through a high-pass filter and a low-pass filter. The high-frequency components, in other word, the roughness was employed to characterize the out-of-plane deformation under sub-grain scale. By calculating the local variance maps, the slip bands can be revealed. The dwell-fatigue test was subsequently carried out after the surface characterization. Unfortunately, no cracks were observed within the area inspected. The relation between out-of-plane deformation along slip bands and the crack initiation remained unclear.
図・表・数式 / Figures, Tables and Equations
Fig.1 Local variance maps (left), and line profiles of local variance and F-values on a line crossing beta-colony, alpha-grain and grain boundary (right)
その他・特記事項（参考文献・謝辞等） / Remarks(References and Acknowledgements)
成果発表・成果利用 / Publication and Patents
論文・プロシーディング（DOIのあるもの） / DOI (Publication and Proceedings)
口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.
特許 / Patents
特許出願件数 / Number of Patent Applications：0件
特許登録件数 / Number of Registered Patents：0件