【公開日:2024.07.25】【最終更新日:2024.07.05】
課題データ / Project Data
課題番号 / Project Issue Number
23TU0136
利用課題名 / Title
Surface modification by severe plastic deformation of high entropy alloys and metallic glasses
利用した実施機関 / Support Institute
東北大学 / Tohoku Univ.
機関外・機関内の利用 / External or Internal Use
内部利用(ARIM事業参画者以外)/Internal Use (by non ARIM members)
技術領域 / Technology Area
【横断技術領域 / Cross-Technology Area】(主 / Main)計測・分析/Advanced Characterization(副 / Sub)-
【重要技術領域 / Important Technology Area】(主 / Main)次世代ナノスケールマテリアル/Next-generation nanoscale materials(副 / Sub)高度なデバイス機能の発現を可能とするマテリアル/Materials allowing high-level device functions to be performed
キーワード / Keywords
high entropy alloys, metallic glasses,電子顕微鏡/ Electronic microscope,集束イオンビーム/ Focused ion beam
利用者と利用形態 / User and Support Type
利用者名(課題申請者)/ User Name (Project Applicant)
Louzguine Dmitri
所属名 / Affiliation
Tohoku University, WPI Advanced Institute for Materials Research,
共同利用者氏名 / Names of Collaborators in Other Institutes Than Hub and Spoke Institutes
ARIM実施機関支援担当者 / Names of Collaborators in The Hub and Spoke Institutes
伊藤俊,竹中佳生
利用形態 / Support Type
(主 / Main)機器利用/Equipment Utilization(副 / Sub),技術代行/Technology Substitution
利用した主な設備 / Equipment Used in This Project
TU-517:透過電子顕微鏡
TU-508:集束イオンビーム加工装置
報告書データ / Report
概要(目的・用途・実施内容)/ Abstract (Aim, Use Applications and Contents)
High entropy alloys or alloys without the base component constitute a promising materials group for future society, where the energy and environmental problems are recognized as serious factors for the sustainable world. In this study, we examined severely deformed microstructures of these alloys by using transmission electron microscopy.
実験 / Experimental
High entropy alloys were prepared by casting, following annealing, quenching and deformation (hot and cold one). In order to observe possible structural details at the atomic level, we employed an ion polishing technique for thin specimen preparation for transmission electron microscopy (TEM) observation.
結果と考察 / Results and Discussion
Fig. 1 shows a bright field image of the specimen, where microstructure indicated complex details within the severely deformed specimen. Fig. 2 shows a dark field image, showing that orientation of the grain are nearly uniform but the complex contrasts, arising from dynamical effects, suggests there exist crystallographic local variations. These studies revealed the observations using TEM are very useful for understanding local structure of these materials.
図・表・数式 / Figures, Tables and Equations
Fig1 bright field TEM image of a high entropy alloy
Fig2 A dark field image of the same material
その他・特記事項(参考文献・謝辞等) / Remarks(References and Acknowledgements)
成果発表・成果利用 / Publication and Patents
論文・プロシーディング(DOIのあるもの) / DOI (Publication and Proceedings)
口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.
特許 / Patents
特許出願件数 / Number of Patent Applications:0件
特許登録件数 / Number of Registered Patents:0件