【公開日：2024.07.25】【最終更新日：2024.05.17】
課題データ / Project Data
課題番号 / Project Issue Number
23TU0043
利用課題名 / Title
Evaluation of physical properties of Al whiskers
利用した実施機関 / Support Institute
東北大学 / Tohoku Univ.
機関外・機関内の利用 / External or Internal Use
内部利用（ARIM事業参画者以外）/Internal Use (by non ARIM members)
技術領域 / Technology Area
【横断技術領域 / Cross-Technology Area】（主 / Main）計測・分析/Advanced Characterization（副 / Sub）-
【重要技術領域 / Important Technology Area】（主 / Main）次世代ナノスケールマテリアル/Next-generation nanoscale materials（副 / Sub）高度なデバイス機能の発現を可能とするマテリアル/Materials allowing high-level device functions to be performed
キーワード / Keywords
whiskers,電子顕微鏡/ Electronic microscope,集束イオンビーム/ Focused ion beam,ナノワイヤー・ナノファイバー/ Nanowire/nanofiber
利用者と利用形態 / User and Support Type
利用者名（課題申請者）/ User Name (Project Applicant)
LUDWIG THOMAS
所属名 / Affiliation
東北大学大学院 工学研究科
共同利用者氏名 / Names of Collaborators in Other Institutes Than Hub and Spoke Institutes
ARIM実施機関支援担当者 / Names of Collaborators in The Hub and Spoke Institutes
今野豊彦,長迫実,竹中佳生
利用形態 / Support Type
（主 / Main）技術代行/Technology Substitution（副 / Sub）,技術補助/Technical Assistance
利用した主な設備 / Equipment Used in This Project
TU-504：超高分解能透過電子顕微鏡
TU-517：透過電子顕微鏡
TU-508：集束イオンビーム加工装置
報告書データ / Report
概要（目的・用途・実施内容）/ Abstract (Aim, Use Applications and Contents)
The current study involves the fabrication and characterization of Al whiskers for future application as functional components like sensors in advanced material systems. Tensile strength of Al whiskers is investigated, whereas transmission electron microscope (TEM) observation was conducted to connect the changes in the crystal structure to the observed tensile strength. In order to rule out any influence by ion beam irradiation on dislocation structure within the whiskers, experiments were conducted without prior focused ion beam (FIB) thinning.
実験 / Experimental
Whiskers were transferred after tensile testing to Mo grids using electron beam hardening glue. The TEM used for observation were model JEM-2000EXII and JEM-ARM200F.
結果と考察 / Results and Discussion
As the atomic structure of the observed whiskers was highly ordered,
whiskers even larger than 500 nm could be observed to a satisfactory degree.
Also, dislocation contrasts were clearly distinguishable. As shown in Fig. 1, whiskers
showed signs of newly formed grains after testing, as compared to a single
crystal structure prior to testing. The weak beam method in dark field mode was used to identify
the contrasts of different grains and the corresponding signal in the
diffraction pattern. The degree of grain formation appears to
vary, presumably due to different degrees of stress accumulation in the whisker
during testing.
図・表・数式 / Figures, Tables and Equations
Fig. 1: Newly formed grains at fracture tip.
その他・特記事項（参考文献・謝辞等） / Remarks(References and Acknowledgements)
We thank Prof. Emerit. T. Konno for his great, valuable technical support during observation.
成果発表・成果利用 / Publication and Patents
論文・プロシーディング（DOIのあるもの） / DOI (Publication and Proceedings)
-
Thomas H. Ludwig, Pencil‐Shaped Necking of Thick Al Whisker Grown by Stress‐Induced Migration and Enhancement of Tensile Strength, Advanced Engineering Materials, 26, (2024).
DOI: doi.org/10.1002/adem.202302081
口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.
- T. H. Ludwig、"Effect of fabrication condition on the tensile strength of Al whiskers grown from passivated Al thin films by stress induced migration" 第30回 機械材料・材料加工技術講演会(筑波), 令和5年9月28日
特許 / Patents
特許出願件数 / Number of Patent Applications：0件
特許登録件数 / Number of Registered Patents：0件