利用報告書 / User's Reports


【公開日:2024.07.25】【最終更新日:2024.05.19】

課題データ / Project Data

課題番号 / Project Issue Number

23NM5166

利用課題名 / Title

Tunable structural order/disorder functional ceramics: a novel prospect of sulfides-based materials

利用した実施機関 / Support Institute

物質・材料研究機構 / NIMS

機関外・機関内の利用 / External or Internal Use

内部利用(ARIM事業参画者以外)/Internal Use (by non ARIM members)

技術領域 / Technology Area

【横断技術領域 / Cross-Technology Area】(主 / Main)計測・分析/Advanced Characterization(副 / Sub)加工・デバイスプロセス/Nanofabrication

【重要技術領域 / Important Technology Area】(主 / Main)革新的なエネルギー変換を可能とするマテリアル/Materials enabling innovative energy conversion(副 / Sub)-

キーワード / Keywords

Sulfide-based ceramics,電子顕微鏡/ Electronic microscope


利用者と利用形態 / User and Support Type

利用者名(課題申請者)/ User Name (Project Applicant)

Bourgès Cédric

所属名 / Affiliation

物質・材料研究機構

共同利用者氏名 / Names of Collaborators in Other Institutes Than Hub and Spoke Institutes
ARIM実施機関支援担当者 / Names of Collaborators in The Hub and Spoke Institutes
利用形態 / Support Type

(主 / Main)機器利用/Equipment Utilization(副 / Sub),技術補助/Technical Assistance


利用した主な設備 / Equipment Used in This Project

NM-401:300kV収差補正電子顕微鏡
NM-403:TEM試料自動作製FIB-SEM複合装置
NM-647:FE-SEM+EDX [S-4800]
NM-648:FE-SEM+EDX [SU8000]
NM-649:FE-SEM+EDX [SU8230]


報告書データ / Report

概要(目的・用途・実施内容)/ Abstract (Aim, Use Applications and Contents)

The initial and global scientific research objective is to gain a better understanding of the synthesis/sintering process effect in functional sulfide-based ceramics to produce order or defect materials as desired to enhance their optical and/or thermoelectric properties.
For evidence the presence of structural defect, the electronic microscopy is crucial as it can observe the microstructure/atomic arrangement or determine the local chemical composition of the material.

実験 / Experimental

I prepared fractured or finely polished samples for the SEM facilities to observe the sample's microstructure or performed EDX analysis qualitatively or quantitatively. Mostly images using the SE (secondary electron) sensor or phase contrast using the BSE (Backscattered electron) sensor of the SEM are used. Besides the best sample, I used the FIB-SEM to prepare thin polycrystalline samples suitable for the TEM observation with thicknesses below 50 nm. The TEM observations are performed with a low voltage acceleration due to the sensitivity of the sulfide samples.

結果と考察 / Results and Discussion

I measured fractured or polished samples by the SEM facilities as a routine to quantify the grain size, porosity, and composition of my Cu-based sulfide materials to create a correlation with their respective physicochemical properties and create a materials specification. Complementary analysis by TEM, enables the possibility to confirm the nanoscale size of the crystallites in some of my materials difficult to observe by SEM. A tentative of HAADF analysis by TEM has been attempt to observe the atomic contrast arrangement in my sulfides as evidence of the presence of disorder within it.

図・表・数式 / Figures, Tables and Equations
その他・特記事項(参考文献・謝辞等) / Remarks(References and Acknowledgements)


成果発表・成果利用 / Publication and Patents

論文・プロシーディング(DOIのあるもの) / DOI (Publication and Proceedings)
  1. Cédric Bourgès, Investigation of Mn Single and Co-Doping in Thermoelectric CoSb3-Skutterudite: A Way Toward a Beneficial Composite Effect, ACS Applied Energy Materials, 6, 9646-9656(2023).
    DOI: https://doi.org/10.1021/acsaem.3c01725
口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.
  1. C. Bourges, "Process influence on Sulfide-based Ceramics for Enhancing their Thermoelectric Performances Assisted by Active Machine Learning" at MRM2023-IUMRS-ICA2023, Kyoto, Japan.
  2. C. Bourges," How can data science support and push forward material synthesis? Example with a metal-sulfides compounds", at The flux growth society 2023, Tsukuba, Japan.
  3. C. Bourges, "A tentative of an initial material specification of the process influence on sulfide-based ceramics for enhancing their thermoelectric properties", at TMS2023, San Diego, USA.
特許 / Patents

特許出願件数 / Number of Patent Applications:0件
特許登録件数 / Number of Registered Patents:0件

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