【公開日：2024.07.25】【最終更新日：2024.04.11】
課題データ / Project Data
課題番号 / Project Issue Number
23KT0022
利用課題名 / Title
A sample preparation of the preferential corrosion attack area of NAB cut by FIB
利用した実施機関 / Support Institute
京都大学 / Kyoto Univ.
機関外・機関内の利用 / External or Internal Use
外部利用/External Use
技術領域 / Technology Area
【横断技術領域 / Cross-Technology Area】（主 / Main）計測・分析/Advanced Characterization（副 / Sub）-
【重要技術領域 / Important Technology Area】（主 / Main）マルチマテリアル化技術・次世代高分子マテリアル/Multi-material technologies / Next-generation high-molecular materials（副 / Sub）マテリアルの高度循環のための技術/Advanced materials recycling technologies
キーワード / Keywords
集束イオンビーム/ Focused ion beam,高度素材識別技術/ Advanced material identification technology
利用者と利用形態 / User and Support Type
利用者名（課題申請者）/ User Name (Project Applicant)
Sriraksasin Kaysinee
所属名 / Affiliation
King Mongkut:s University of Technology Thonburi
共同利用者氏名 / Names of Collaborators in Other Institutes Than Hub and Spoke Institutes
ARIM実施機関支援担当者 / Names of Collaborators in The Hub and Spoke Institutes
利用形態 / Support Type
（主 / Main）技術補助/Technical Assistance（副 / Sub）-
利用した主な設備 / Equipment Used in This Project
報告書データ / Report
概要（目的・用途・実施内容）/ Abstract (Aim, Use Applications and Contents)
Nickel aluminum bronze (NAB) is a copper-based alloy with a multi-phase alloy, comprising of a , β ¢ , and four different kinds of k phases. A corrosion of this material was reported as a preferential corrosion attack at the a / k III interface and severely corrosion damaged at the b ¢ phase in seawater. To increase its corrosion resistance, it is crucial to investigate the corrosion behaviors in the attack area. However, the limited area at the interface makes sample preparation challenging during the small area of an attack phase. Because Focus Ion Beam (FIB) can be precisely cut at an intended location, therefore it is chosen for sample preparation and the microstructure of FIB's sample was report in this work.
実験 / Experimental
The NAB specimen was cut to a dimension of 1 mm x 1 mm x 0.5 mm then ground with 4000-grit sandpaper and followed by polishing with 3-, 1- and 1/4-mm diamond sticks. A small region of the a/kIII interface of the specimen was located, ion-milled and cut at by Ga+ ions using JEOL JIB-4700F Focus Ion Beam-SEM.
結果と考察 / Results and Discussion
SEM image of the microstructure of NAB ( Figure 1) reveals large, bright area of a phase, while the k III phases indicate a small steak line with a dark color. Accordingly, the interface of these phases was a preferential corrosion attack phase, so the design area for FIB's cut was located at the interface. The focus area was coat with carbon to protect its surface, then cut into small section. After that, the a / k III interface area was thinned to a thickness less than 100 nm by ion milling. The microstructure of the FIB's sample is composed of a and k III phases that correspond to the design area depicted in Figure 2 . It appears that FIB was used to precisely cut a small region of interest in the vicinity of NAB. In addition , the sample surface of the FIB was smooth and clear for the upcoming TEM analytical characterization stage.
図・表・数式 / Figures, Tables and Equations
Figure 1 the expected location at the a/kIII interface for FIB’s cut
Figure 2 FIB’s sample
その他・特記事項（参考文献・謝辞等） / Remarks(References and Acknowledgements)
成果発表・成果利用 / Publication and Patents
論文・プロシーディング（DOIのあるもの） / DOI (Publication and Proceedings)
口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.
特許 / Patents
特許出願件数 / Number of Patent Applications：0件
特許登録件数 / Number of Registered Patents：0件