【公開日：2023.07.31】【最終更新日：2023.05.16】
課題データ / Project Data
課題番号 / Project Issue Number
22UT0234
利用課題名 / Title
Perovskiteの表面分析
利用した実施機関 / Support Institute
東京大学
機関外・機関内の利用 / External or Internal Use
内部利用（ARIM事業参画者以外）/Internal Use (by non ARIM members)
技術領域 / Technology Area
【横断技術領域 / Cross-Technology Area】（主 / Main）計測・分析/Advanced Characterization（副 / Sub）-
【重要技術領域 / Important Technology Area】（主 / Main）マルチマテリアル化技術・次世代高分子マテリアル/Multi-material technologies / Next-generation high-molecular materials（副 / Sub）-
キーワード / Keywords
X線回折/X-ray diffraction,太陽電池/ Solar cell,コンポジット材料/ Composite material
利用者と利用形態 / User and Support Type
利用者名（課題申請者）/ User Name (Project Applicant)
オウ チウ
所属名 / Affiliation
東京大学
共同利用者氏名 / Names of Collaborators in Other Institutes Than Hub and Spoke Institutes
ARIM実施機関支援担当者 / Names of Collaborators in The Hub and Spoke Institutes
利用形態 / Support Type
（主 / Main）機器利用/Equipment Utilization（副 / Sub）-
利用した主な設備 / Equipment Used in This Project
報告書データ / Report
概要（目的・用途・実施内容）/ Abstract (Aim, Use Applications and Contents)
We demonstrate a 40-nm thick chiral perovskite film. As the material engineering strategy, we mix (MBA)PbI3 crystals with the helical chain-shaped Pb-I framework and (MBA)2PbI4 crystals with a plane framework, and we checked the XRD patterns.
実験 / Experimental
The perovskite films were fabricated by varying the weight ratio between (MBA)PbI3 and (MBA)2PbI4 in the precursor solution, i.e., 100:0, 75:25, 50:50, 25:75, and 0:100 wt.%.
結果と考察 / Results and Discussion
X-ray diffraction (XRD) patterns of these five films show obvious diffraction peaks revealing high crystallinity. The diffraction peaks at 8.3 and 16.7°can be assigned to (0 0 2) and (0 0 4) of the (MBA)PbI3 phase, while the diffraction peaks at 6.1, 12.3, 18.5, 24.7, and 31.0° can be assigned to (0 0 2), (0 0 4), (0 0 6), (0 0 8) and (0 0 10) planes of the (MBA)2PbI4 phase (marked as red diamonds). As evidenced by only (0 0 2l) XRD peaks observed in all thin films, the (MBA)PbI3 phase chains and (MBA)2PbI4 phase planes should be highly oriented parallel to the substrate. Compared with the pure (MBA)PbI3 and (MBA)2PbI4 thin films, their hybrid thin films do not exhibit new XRD peak, obvious peak shift, or full-width-at-half-maximum change, thus indicating that these thin films by hybridizing the two materials do not possess new crystal structure or different orientations.
図・表・数式 / Figures, Tables and Equations
XRD patterns about the perovskite thin film
その他・特記事項（参考文献・謝辞等） / Remarks(References and Acknowledgements)
なし
成果発表・成果利用 / Publication and Patents
論文・プロシーディング（DOIのあるもの） / DOI (Publication and Proceedings)
口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.
特許 / Patents
特許出願件数 / Number of Patent Applications：0件
特許登録件数 / Number of Registered Patents：0件