【公開日：2023.07.31】【最終更新日：2023.05.16】

課題データ / Project Data

課題番号 / Project Issue Number

22UT0234

利用課題名 / Title

Perovskiteの表面分析

利用した実施機関 / Support Institute

東京大学 / Tokyo Univ.

機関外・機関内の利用 / External or Internal Use

内部利用（ARIM事業参画者以外）/Internal Use (by non ARIM members)

技術領域 / Technology Area

【横断技術領域 / Cross-Technology Area】（主 / Main）計測・分析/Advanced Characterization（副 / Sub）-

【重要技術領域 / Important Technology Area】（主 / Main）マルチマテリアル化技術・次世代高分子マテリアル/Multi-material technologies / Next-generation high-molecular materials（副 / Sub）-

キーワード / Keywords

X線回折/X-ray diffraction,太陽電池/ Solar cell,コンポジット材料/ Composite material

利用者と利用形態 / User and Support Type

利用者名（課題申請者）/ User Name (Project Applicant)

オウ チウ

所属名 / Affiliation

東京大学

共同利用者氏名 / Names of Collaborators in Other Institutes Than Hub and Spoke Institutes

ARIM実施機関支援担当者 / Names of Collaborators in The Hub and Spoke Institutes

利用形態 / Support Type

（主 / Main）機器利用/Equipment Utilization（副 / Sub）-

利用した主な設備 / Equipment Used in This Project

UT-202：高輝度In-plane型X線回折装置

報告書データ / Report

概要（目的・用途・実施内容）/ Abstract (Aim, Use Applications and Contents)

We demonstrate a 40-nm thick chiral perovskite film. As the material engineering strategy, we mix (MBA)PbI₃ crystals with the helical chain-shaped Pb-I framework and (MBA)₂PbI₄ crystals with a plane framework, and we checked the XRD patterns.

実験 / Experimental

The perovskite films were fabricated by varying the weight ratio between (MBA)PbI₃ and (MBA)₂PbI₄ in the precursor solution, i.e., 100:0, 75:25, 50:50, 25:75, and 0:100 wt.%. 

結果と考察 / Results and Discussion

X-ray diffraction (XRD) patterns of these five films show obvious diffraction peaks revealing high crystallinity. The diffraction peaks at 8.3 and 16.7°can be assigned to (0 0 2) and (0 0 4) of the (MBA)PbI₃ phase, while the diffraction peaks at 6.1, 12.3, 18.5, 24.7, and 31.0° can be assigned to (0 0 2), (0 0 4), (0 0 6), (0 0 8) and (0 0 10) planes of the (MBA)₂PbI₄ phase (marked as red diamonds). As evidenced by only (0 0 2l) XRD peaks observed in all thin films, the (MBA)PbI₃ phase chains and (MBA)₂PbI₄ phase planes should be highly oriented parallel to the substrate. Compared with the pure (MBA)PbI₃ and (MBA)₂PbI₄ thin films, their hybrid thin films do not exhibit new XRD peak, obvious peak shift, or full-width-at-half-maximum change, thus indicating that these thin films by hybridizing the two materials do not possess new crystal structure or different orientations.

図・表・数式 / Figures, Tables and Equations

XRD patterns about the perovskite thin film

その他・特記事項（参考文献・謝辞等） / Remarks(References and Acknowledgements)

なし

成果発表・成果利用 / Publication and Patents

論文・プロシーディング（DOIのあるもの） / DOI (Publication and Proceedings)

口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.

特許 / Patents

特許出願件数 / Number of Patent Applications：0件
特許登録件数 / Number of Registered Patents：0件