【公開日：2023.07.31】【最終更新日：2023.05.16】
課題データ / Project Data
課題番号 / Project Issue Number
22UT0042
利用課題名 / Title
鉄系金属の表面分析
利用した実施機関 / Support Institute
東京大学
機関外・機関内の利用 / External or Internal Use
内部利用（ARIM事業参画者以外）/Internal Use (by non ARIM members)
技術領域 / Technology Area
【横断技術領域 / Cross-Technology Area】（主 / Main）計測・分析/Advanced Characterization（副 / Sub）-
【重要技術領域 / Important Technology Area】（主 / Main）その他/Others（副 / Sub）-
キーワード / Keywords
軟磁性材料,イオンミリング/Ion milling
利用者と利用形態 / User and Support Type
利用者名（課題申請者）/ User Name (Project Applicant)
方 正隆
所属名 / Affiliation
東京大学
共同利用者氏名 / Names of Collaborators in Other Institutes Than Hub and Spoke Institutes
ARIM実施機関支援担当者 / Names of Collaborators in The Hub and Spoke Institutes
利用形態 / Support Type
（主 / Main）機器利用/Equipment Utilization（副 / Sub）-
利用した主な設備 / Equipment Used in This Project
報告書データ / Report
概要（目的・用途・実施内容）/ Abstract (Aim, Use Applications and Contents)
To explore the magnetic property of the soft-ferromagnetic amorphous material, the ion-milling technique is necessary to expose the cross-section of the tested amorphous sample. Because it has the advantage in polishing the surface without introducing any mechanical polishing induced residual strain, which can highly affect the magnetic property of the amorphous. Therefore, the ion-milling on the amorphous samples was conducted, followed by the in-depth material characterizations in terms of the microstructure and corresponding magnetic domain.
実験 / Experimental
Firstly, the soft-ferromagnetic amorphous samples were annealed and pre-stressed with different strain level. Then, the ion-milling was conducted to expose the cross-section for the electron back scattered diffraction pattern observation and magnetic domain analysis
結果と考察 / Results and Discussion
The results show that the ion-milling is able to produce a well-polished amorphous sample for observing the nanocrystalline condition. Based on this, the variations of the magnetic domain upon the residual strain were comprehensively investigated, showing that a high magnetic field energy is needed to align the magnetic moment especially near the grain boundary, which the stack fault is heavily accumulated by the strain.
図・表・数式 / Figures, Tables and Equations
その他・特記事項（参考文献・謝辞等） / Remarks(References and Acknowledgements)
福川昌宏様に感謝します。
成果発表・成果利用 / Publication and Patents
論文・プロシーディング（DOIのあるもの） / DOI (Publication and Proceedings)
-
Zhenglong Fang, Strain-induced magnetic degradation in shearing FeSiB nanocrystalline thin foils analyzed by magneto-optical Kerr effect, CIRP Annals, 71, 493-496(2022).
DOI: 10.1016/j.cirp.2022.04.073
口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.
- Z. Fang, Y. Meng, M. Nakao, CIRP General assembly, 2022, August, Bilbao, Spain.
特許 / Patents
特許出願件数 / Number of Patent Applications：0件
特許登録件数 / Number of Registered Patents：0件