【公開日：2023.07.28】【最終更新日：2023.05.25】
課題データ / Project Data
課題番号 / Project Issue Number
22TU0027
利用課題名 / Title
Crystallization behavior of metallic glasses
利用した実施機関 / Support Institute
東北大学
機関外・機関内の利用 / External or Internal Use
外部利用/External Use
技術領域 / Technology Area
【横断技術領域 / Cross-Technology Area】（主 / Main）計測・分析/Advanced Characterization（副 / Sub）-
【重要技術領域 / Important Technology Area】（主 / Main）高度なデバイス機能の発現を可能とするマテリアル/Materials allowing high-level device functions to be performed（副 / Sub）-
キーワード / Keywords
バルクアモルファス合金,電子顕微鏡/Electron microscopy
利用者と利用形態 / User and Support Type
利用者名（課題申請者）/ User Name (Project Applicant)
Louzguine Dmitri Valentinovich
所属名 / Affiliation
産業技術総合研究所 オープンイノベーションラボラトリ
共同利用者氏名 / Names of Collaborators in Other Institutes Than Hub and Spoke Institutes
ARIM実施機関支援担当者 / Names of Collaborators in The Hub and Spoke Institutes
利用形態 / Support Type
（主 / Main）機器利用/Equipment Utilization（副 / Sub）-
利用した主な設備 / Equipment Used in This Project
報告書データ / Report
概要（目的・用途・実施内容）/ Abstract (Aim, Use Applications and Contents)
Structural features of the Pd42.5Cu30Ni7.5P20 and Pt42.5Cu27Ni9.5P21 metallic glasses are studied in the present work by high-resolution transmission electron microscopy. The results indicate that Pd42.5Cu30Ni7.5P20 is a true bulk glass-former containing no crystalline particles/nuclei, while Pt42.5Cu27Ni9.5P21 is a crystal growth-controlled type bulk glass-former which contains nanoparticles of about 1 nm size with a different chemical composition. These structural differences are manifested in room-temperature mechanical properties. Thermodynamic calculations are also used to support the observed features.
実験 / Experimental
Ingots of the Pd42.5Cu30Ni7.5P20 and Pt42.5Cu27Ni9.5P21 alloys (the compositions are given in nominal atomic/molar percentages) were prepared by smelting of pure elements of 99.9 % mass purity. The structures of the samples were examined by conventional X-ray diffractometry (XRD) with CuKa radiation. Transmission electron microscopy observation, including collection of selected-area electron diffraction (SAED) and nanobeam diffraction (NBD) (1 nm probe size) patterns were carried out using a TOPCON EM-002B microscope operating at 160 kV. Scanning TEM (STEM) observation and the energy-dispersive X-ray (EDX) analysis were performed using JEOL-ARM200F microscope operating at 200 kV. Oxygen content in the studied glassy alloys was measured by using infrared absorption (IA) after fusion under He gas.
結果と考察 / Results and Discussion
Significant difference in fine structure of the Pd42.5Cu30Ni7.5P20 and Pt42.5Cu27Ni9.5P21 metallic glasses was found (Figs. 1 and 2). The Pd42.5Cu30Ni7.5P20 metallic glass is a true bulk glass-former containing no crystalline particles/nuclei (Fig. 1), while the Pt42.5Cu27Ni9.5P21 metallic glass contains cF4 (partially ordered as cP4) nanoparticles (Fig. 2) both in bulk and ribbon form. This peculiar structure is rather the origin of much higher plasticity of Pt-based BMGs compared to Pd-based ones in general, and in the present case. Moreover, the microstructure analysis with a complex mathematical approach provided accurate data and enlightened the structure features of a known metallic glass. The analysis of EDX maps indicated that these nanoparticles are enriched in Cu and Ni and depleted in Pt and P. Low spatial correlation with O indicated that these nanoparticles are not oxides. Thermodynamic calculations support the observed features.
図・表・数式 / Figures, Tables and Equations
Fig.1 High-resolution TEM (HRTEM) (a) and STEM bright-field (b) images of the Pd42.5Cu30Ni7.5P20 metallic glass in ribbon form, together with a nanobeam diffraction pattern (inset).
Fig.2 High-resolution TEM (HRTEM) (a) and STEM bright-field (b) images of the Pt42.5Cu27Ni9.5P21 metallic glass in ribbon form, together with a nanobeam diffraction pattern (inset).
その他・特記事項（参考文献・謝辞等） / Remarks(References and Acknowledgements)
成果発表・成果利用 / Publication and Patents
論文・プロシーディング（DOIのあるもの） / DOI (Publication and Proceedings)
口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.
特許 / Patents
特許出願件数 / Number of Patent Applications：0件
特許登録件数 / Number of Registered Patents：0件