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件名【ICMTS 2017】International Conference of Microelectronic Test Structures
開始日時2017/03/28 17:00
終了日時2017/03/31 17:00
場所Minatec, Grenoble, France
連絡先alain.toffoli(at)cea.fr
詳細 The scope of this conference is to bring together designers and users of test structures to discuss recent developments and futures directions.

Topics:
・R&D and Manufacture of IC, M(N)EMS, Sensors, Actuators, Bio, solar, displays, and
  emergent technologies.
・Material - Process - New technologies Characterizations.
・New devices - Memory Cells - Arrays.
・DC - Pulsed - RF: measurements techniques and applications.
・Design methods - Verification - Metrology.
・Devices and Circuits Modeling - Parameter Extraction.
・Matching - Variability.
・Reliability - Wafer level / thermal Product Failure Analysis & prediction.
・Yield Enhancement - Production Process Control.
・Measurements - Statistical - Probing - Throughput - Analysis - Strategies.

Sponsor:

IEEE Electron Devices Society
Electronics & Information Technology Lab of the French Atomic Energy Commision - CEA Leti

Paper Submission Deadline: January 15, 2017

Please go to the following URL for more information.
URL:
http://icmts2017.insight-outside.fr
https://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=38854