Advanced Characterization Nanotechnology Platform - Establishment of shared-use of advanced characterization equipment
(Leading Institute of the Plaform:National Institute for Materials Science)

By linking advanced microstructural characterization facilities into a network, we contribute to a solution of scientific and technical problems, strengthen Japanese nanotechnology research basis, and educate young researchers and engineers so that an acceleration of researches leading to the innovation in the field of nanotechnology and material science could be promoted.
【Contact details】
    (*Please replace "(at)" with @.)


About this platform

The "Advanced Characterization Nanotechnology Platform (ACNP)" is composed of 10 institutes and 1 representative organization. We construct a network of advanced characterization shared-facilities to contribute to the innovation by solving the problems of academia and industry in the fields of nanotechnology and material science, to enhance and strengthen the Japanese nanotechnology research basis, and to support human resource development in a nanotechnology field. Further, by sharing advanced characterization facilities and making achievements top-level in the world, we promote the collaboration among industries, universities and the government.

Objectives and Missions of Advanced Characterization Nanotechnology Platform


  • Multi-beam ultrahigh-voltage electron microscope (JEM-ARM-1300)
  • Laser ultrahigh-voltage electron microscope (FEI Titan 80-300)
  • Atomic-resolution analytical electron microscope (FEI Titan Cubed)
  • Positron probe micro analyzer (PPMA)
  • Aberration-corrected atomic-resolution STEM (JEM-ARM200F Cold FE)
  • Reaction science high-voltage scanning transmission electron microscope (RS-HVSTEM)
  • Ultralow-temperature high-resolution transmission electron microscope (JEM-2100F(G5))
  • 3000kV ultra-high voltage electron microscope (H-3000)
  • Synchrotron radiation beamlines at Spring8
  • 3D nanostructure analysis ultrahigh-voltage electron microscope (JEM-1300NEF)
  • List of related institutes


    【Leading Institute of the Platform】

     National Institute for Materials Science
    Promotion office for Advanced Characterization Nanotechnology Platform

    1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan
     TEL. +81-(0)29-859-2139


    Office for the Promotion of Nanotechnology Collaborative Research, Hokkaido University
    03-305 in Sosei, Hokudai, N21W10 Kita-ku, Sapporo 001-0021, Japan
     +81-(0)11-706-9340, FAX +81-(0)11-706-9376

     The Center for Integrated Nanotechnology Support (CINTS) in Tohoku University
    2-1-1 Katahira, Aobaku Sendai, Miyagi 980-8577, Japan

    National Institute for Materials Science (NIMS)
    NIMS Microstructural Characterization Platform for advanced nanomaterials
    1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan

     National Institute of Advanced Industrial Science and Technology (AIST)
    Research Institute of Instrumentation Frontier (RIIF)
    Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
     +81-(0)29-861-5300, FAX +81(0)29-861-5881

    The University of Tokyo
    2-11-16, Yayoi, Bunkyo-ku, Tokyo 113-8656, Japan

     Nagoya University
    High Voltage Electron Microscope Laboratory, Nagoya University
    EcoTopia Science Institute
    Furo-cho, Chikusa-ku, Nagoya, Aichi 464-8603, Japan
     +81-(0)52-789-3632, FAX +81-(0)52-789-3174

     Institute for Chemical Research, Kyoto University
    Gokasho, Uji, Kyoto 611-0011, Japan

     Research Center for Ultra-High Voltage Electron Microscopy, Osaka University
    7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
     +81-(0)6-6879-7941, FAX +81-(0)6-6879-7942

    Japan Atomic Energy Agency, JAEA Advanced Nanotechnology Platform
    1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan

    The Ultramicroscopy Research Center, Kyushu University
    Motooka 744, Nishi-ku, Fukuoka 819-0395, Japan