National Institute of Advanced Industrial Science and Technology(AIST)
University of Tsukuba
The University of Tokyo
Tokyo Institute of Technology
Japan Advanced Institute of Science and Technology(JAIST)
Institute for Molecular Science
Nagoya Institute of Technology
Toyota Technological Institute
Nara Institute of Science and Technology(NAIST)
Japan Atomic Energy Agency(JAEA)
Kitakyushu Foundation for the Advancement of Industry Science and Technology(FAIS)
Excellent Support Center for Reaction, Nanomaterial and Biological Science by Electron Microscopy (Nagoya University)
In this project conducted by High Voltage Electron Microscope Laboratory of Nagoya University, a reaction science high voltage scanning transmission electron microscope and many high performance electron microscopes (cluster) are provided for researches of material- and biological-science. The project enables microscopic elemental analysis, 3D observation, gas environment observation and extremely high resolution TEM/STEM and EELS observations and makes it possible to expand use through diversification of supporting items. The Nagoya University electron microscope group provides comprehensive support for the implementation of this project.
【Contact details】 +81-(0)52-789-3632 nanoplat(at)nagoya-microscopy.jp (*Please replace "(at)" with @.)
The center provides a normal fee-charging program and a funding program. The later is a free trial use for only one sample at the first time. ( Foreign organization is not available.) User can select comprehensive support as desired from technical consultation, experimental design, sample fabrication, analysis, consulting and so on. Request for collaborative research will be also accepted. In principle, instruments in the laboratory will be operated by our technical staffs with you.
Main instruments: RE-HVSTEM allows in situ observations and EELS in gas atmospheres (N2, O2, H2, CO+air, etc.), in the pressure range of 1x10-6 - 1.3x104 Pa. A specimen holder inclinable up to ±70° in a vacuum and a fully rotatable holder are effective for 3D observations of thicker biological and non-biological specimens. A liquid Helium holder, a double-tilt heating holder, a high-temperature heating holder and a nano-indentation holder are also available. Moreover, high resolution observation less than 0.1 nm with ACSTEM, observation of nano electromagnetic field by electron holography with Cold-FETEM, and chemical analysis in the temperature range of 100 - 1000K using WDX, EELS and CL installed on Spectroscopic STEM can be conducted.
High-resolution TEM image of a [11-20] oriented cubic silicon carbide (SiC), whose dumbbell structure spacing of 0.109 nm is clearly resolved.
(200) lattice fringes of a (001) gold thin film in a vacuum (a) and nitrogen gas atmospheres (b:1,300 Pa, c: 5,800Pa, d: 11,000Pa)
3D tomographic image of a chromosome of a rat obtained using the TEM mode at the accelerating voltage of 1 MV.
STEM-EELS mapping images showing different chemical states of silicon in a semiconductor device (a, b and c) and the noise remaining in the original image (d) obtained from the EELS spectra peak-resolved with multivariate curve resolution (MCR) processing (e) .
High Voltage Electron Microscope Laboratory, Nagoya University EcoTopia Science Institute Furo-cho, Chikusa-ku, Nagoya, Aichi 464-8603, Japan +81-(0)52-789-3632, FAX +81-(0)52-789-3174 nanoplat(at)nagoya-microscopy.jp (*Please replace "(at)" with @.)