The Characterization Platform in Hokkaido University
(Hokkaido University)

The Characterization Platform in Hokkaido University provides support for the analysis of surface structure, internal structure, and electronic state. We help users to accelerate their research, development of new products, and techniques, with unique equipment and researchers who have highly advanced knowledge and experience.
Contact to this institute
【Contact details】
 +81-(0)11-706-9340
nanoplat(at)cris.hokudai.ac.jp
    (*Please replace "(at)" with @.)

About this institute

Hokkaido University provides support for the analysis of (1) surface structure, (2) internal structure/3D structure, and (3) electronic state. The surface analysis equipment includes the latest X-ray photoelectron spectrometer, Auger electron spectroscope and electron probe micro analyzer. The internal structure can be studied by several electron microscopes including the world's only ultrahigh-voltage electron microscope with high-energy ion accelerators and Cs STEM/TEM. We also provide sample preparation facilities such as SEM-FIB, a TEM equipped with environmental cell holder, and an ultrahigh-vacuum/ ultralow-temperature/ high-magnetic-field scanning probe microscope. Time-resolved studied can be conducted using an ultrahigh-speed photoelectron microscope and a high-speed spectrum imagining laser confocal microscope.
3D environmental materials analyzerUltrahigh-vacuum/ultralow-temperature/
high-magnetic-field SPM
  
Auger electron spectrometerTime-resolved photoelectron microscopy system
(TR-PEEM)

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Facilities

Contact

Office for the promotion of nanotechnology collaborative research, Hokkaido University
03-305 in Sosei, Hokudai, N21W10 Kita-ku, Sapporo 001-0021, Japan
TEL +81-(0)11-706-9340, FAX +81-(0)11-706-9376
  nanoplat(at)cris.hokudai.ac.jp
   (*Please replace "(at)" with @.)